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Make inclusive scan safe for cases with leading nulls #7432

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merged 9 commits into from
Feb 26, 2021
Merged

Make inclusive scan safe for cases with leading nulls #7432

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58b0185
Add a failing test case that passes a leading null to scan with skipn…
magnatelee Feb 23, 2021
c7f296e
Change the mask scan to make the failing test pass
magnatelee Feb 23, 2021
e19c6d9
Update cpp/tests/reductions/scan_tests.cpp
magnatelee Feb 23, 2021
52d2672
Update cpp/tests/reductions/scan_tests.cpp
magnatelee Feb 23, 2021
c334cdd
Revert "Change the mask scan to make the failing test pass"
magnatelee Feb 24, 2021
55a1cc9
Change set_null_mask to handle empty updates correctly
magnatelee Feb 24, 2021
3a3eb12
Fix to make the style check happy
magnatelee Feb 24, 2021
4d749a3
Make bitmask tests consistent with new contracts
magnatelee Feb 24, 2021
e07a8c0
Test for the new behavior
magnatelee Feb 25, 2021
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3 changes: 2 additions & 1 deletion cpp/src/bitmask/null_mask.cu
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Original file line number Diff line number Diff line change
Expand Up @@ -135,7 +135,8 @@ void set_null_mask(bitmask_type *bitmask,
{
CUDF_FUNC_RANGE();
CUDF_EXPECTS(begin_bit >= 0, "Invalid range.");
CUDF_EXPECTS(begin_bit < end_bit, "Invalid bit range.");
CUDF_EXPECTS(begin_bit <= end_bit, "Invalid bit range.");
Comment on lines 137 to +138
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I feel like these checks should be either merged or we should have more detailed error messages so that the separate checks are useful.

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Looks like these assertions have a similar issue:

cudf/cpp/src/bitmask/null_mask.cu

Lines 387 to 388 in f30be67

CUDF_EXPECTS(begin_bit >= 0, "Invalid range.");
CUDF_EXPECTS(begin_bit <= end_bit, "Invalid bit range.");

cudf/cpp/src/bitmask/null_mask.cu

Lines 478 to 479 in f30be67

CUDF_EXPECTS(start >= 0, "Invalid range.");
CUDF_EXPECTS(start <= stop, "Invalid bit range.");

I didn't bother to see if there are more, but I feel improving such checks deserves a separate PR.

if (begin_bit == end_bit) return;
if (bitmask != nullptr) {
auto number_of_mask_words =
num_bitmask_words(end_bit) - begin_bit / detail::size_in_bits<bitmask_type>();
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21 changes: 21 additions & 0 deletions cpp/tests/reductions/scan_tests.cpp
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Original file line number Diff line number Diff line change
Expand Up @@ -470,6 +470,27 @@ TYPED_TEST(ScanTest, EmptyColumnskip_nulls)
CUDF_TEST_EXPECT_COLUMNS_EQUAL(expected_col_out2, col_out->view());
}

TYPED_TEST(ScanTest, LeadingNulls)
{
auto const v = cudf::test::make_type_param_vector<TypeParam>({100, 200, 300});
auto const b = std::vector<bool>{0, 1, 1};
cudf::test::fixed_width_column_wrapper<TypeParam> const col_in(v.begin(), v.end(), b.begin());
std::unique_ptr<cudf::column> col_out;

// expected outputs
std::vector<TypeParam> out_v(v.size());
std::vector<bool> out_b(v.size(), 0);

// skipna=false
CUDF_EXPECT_NO_THROW(
col_out =
cudf::scan(col_in, cudf::make_sum_aggregation(), scan_type::INCLUSIVE, null_policy::INCLUDE));
cudf::test::fixed_width_column_wrapper<TypeParam> expected_col_out(
out_v.begin(), out_v.end(), out_b.begin());
CUDF_TEST_EXPECT_COLUMN_PROPERTIES_EQUAL(expected_col_out, col_out->view());
CUDF_TEST_EXPECT_COLUMNS_EQUAL(expected_col_out, col_out->view());
}

template <typename T>
struct FixedPointTestBothReps : public cudf::test::BaseFixture {
};
Expand Down