Test in Wokwi #280
Artifacts
Produced during runtime
Name | Size | |
---|---|---|
test-adc-results
|
5.35 KB |
|
test-crypto-results
|
6.11 KB |
|
test-efuse-results
|
101 KB |
|
test-gpio-results
|
32.6 KB |
|
test-gptimer-results
|
6.34 KB |
|
test-hello-world-latest-results
|
5.39 KB |
|
test-hello-world-release-v4.4-results
|
4.29 KB |
|
test-hello-world-release-v5.0-results
|
4.21 KB |
|
test-hello-world-release-v5.1-results
|
4.92 KB |
|
test-hello-world-release-v5.2-results
|
5.14 KB |
|
test-hello-world-release-v5.3-results
|
5.55 KB |
|
test-hello-world-release-v5.4-results
|
5.46 KB |
|
test-i2c-results
|
8.57 KB |
|
test-nvs_flash-results
|
4.87 KB |
|
test-pcnt-results
|
7.9 KB |
|
test-psram-results
|
5.14 KB |
|
test-spi_master-results
|
102 KB |
|
test-timer-results
|
3.79 KB |
|
test-uart-results
|
7.27 KB |
|
test-usb_serial_jtag-results
|
63.6 KB |
|
test-wifi_function-results
|
12.8 KB |
|