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Add missing [[maybe_unused]] annotations in unit tests #33007

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merged 2 commits into from
Apr 16, 2024
Merged

Add missing [[maybe_unused]] annotations in unit tests #33007

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def66f0
Added [[maybe_unused]] to allow building unit test and Silabs apps wi…
lpbeliveau-silabs Apr 16, 2024
94c7874
Added gating of SILABS_LOG_ENABLED on chip_logging
lpbeliveau-silabs Apr 16, 2024
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24 changes: 12 additions & 12 deletions examples/platform/silabs/SoftwareFaultReports.cpp
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Original file line number Diff line number Diff line change
Expand Up @@ -89,18 +89,18 @@ void OnSoftwareFaultEventHandler(const char * faultRecordString)
extern "C" __attribute__((used)) void debugHardfault(uint32_t * sp)
{
#if SILABS_LOG_ENABLED
uint32_t cfsr = SCB->CFSR;
uint32_t hfsr = SCB->HFSR;
uint32_t mmfar = SCB->MMFAR;
uint32_t bfar = SCB->BFAR;
uint32_t r0 = sp[0];
uint32_t r1 = sp[1];
uint32_t r2 = sp[2];
uint32_t r3 = sp[3];
uint32_t r12 = sp[4];
uint32_t lr = sp[5];
uint32_t pc = sp[6];
uint32_t psr = sp[7];
[[maybe_unused]] uint32_t cfsr = SCB->CFSR;
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[[maybe_unused]] uint32_t hfsr = SCB->HFSR;
[[maybe_unused]] uint32_t mmfar = SCB->MMFAR;
[[maybe_unused]] uint32_t bfar = SCB->BFAR;
[[maybe_unused]] uint32_t r0 = sp[0];
[[maybe_unused]] uint32_t r1 = sp[1];
[[maybe_unused]] uint32_t r2 = sp[2];
[[maybe_unused]] uint32_t r3 = sp[3];
[[maybe_unused]] uint32_t r12 = sp[4];
[[maybe_unused]] uint32_t lr = sp[5];
[[maybe_unused]] uint32_t pc = sp[6];
[[maybe_unused]] uint32_t psr = sp[7];

ChipLogError(NotSpecified, "HardFault:");
ChipLogError(NotSpecified, "SCB->CFSR 0x%08lx", cfsr);
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8 changes: 4 additions & 4 deletions src/crypto/tests/TestChipCryptoPAL.cpp
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Expand Up @@ -640,7 +640,7 @@ static void TestRawIntegerToDerInvalidCases(nlTestSuite * inSuite, void * inCont
{ .input = bad_buffer_empty, .output = good_out_buffer, .expected_status = CHIP_ERROR_INVALID_ARGUMENT }
};

int case_idx = 0;
[[maybe_unused]] int case_idx = 0;
for (const ErrorCase & v : error_cases)
{
CHIP_ERROR status = ConvertIntegerRawToDerWithoutTag(v.input, v.output);
Expand Down Expand Up @@ -704,7 +704,7 @@ static void TestReadDerLengthValidCases(nlTestSuite * inSuite, void * inContext)
{ .input_buf = max_byte_length_large_buf, .expected_length = SIZE_MAX },
};

int case_idx = 0;
[[maybe_unused]] int case_idx = 0;
for (const SuccessCase & v : cases)
{
size_t output_length = SIZE_MAX - 1;
Expand Down Expand Up @@ -768,7 +768,7 @@ static void TestReadDerLengthInvalidCases(nlTestSuite * inSuite, void * inContex
{ .input_buf = max_byte_length_large_insufficient_bytes_buf, .expected_status = CHIP_ERROR_BUFFER_TOO_SMALL },
};

int case_idx = 0;
[[maybe_unused]] int case_idx = 0;
for (const ErrorCase & v : error_cases)
{
size_t output_length = SIZE_MAX;
Expand Down Expand Up @@ -2135,7 +2135,7 @@ static void TestX509_VerifyAttestationCertificateFormat(nlTestSuite * inSuite, v
};
// clang-format on

int case_idx = 0;
[[maybe_unused]] int case_idx = 0;
for (auto & testCase : sValidationTestCases)
{
ByteSpan cert = testCase.cert;
Expand Down
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