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chip-cert: Generated New Test Case with Wrong Certificate Validity #22060
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andy31415
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Aug 25, 2022
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chip-cert: Generated New Test Case with Wrong Certificate Validity #22060
andy31415
merged 1 commit into
project-chip:master
from
emargolis:emargolis/feature/new-test-cases-with-wrong-validity
Aug 25, 2022
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PR #22060: Size comparison from a8d12af to 93e3be5 Increases (4 builds for bl602, psoc6)
Decreases (4 builds for efr32, esp32, psoc6, telink)
Full report (32 builds for bl602, cc13x2_26x2, cyw30739, efr32, esp32, k32w, linux, mbed, nrfconnect, psoc6, telink)
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Aug 22, 2022
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PR #22060: Size comparison from 6681060 to 4fb1efa Increases (2 builds for cc13x2_26x2)
Decreases (8 builds for cc13x2_26x2, esp32, k32w, nrfconnect, psoc6, telink)
Full report (43 builds for bl602, cc13x2_26x2, cyw30739, efr32, esp32, k32w, linux, mbed, nrfconnect, psoc6, telink)
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Problem
Need new test vectors with wrong PAI and DAC validity periods.
Change overview
Generated
Testing
To be used in commissioner DUT testing