Make test suite setup and teardown functions static (#33330)

* Make test suite setup and teardown functions static * Restyled by clang-format * Fixed bug in LoopbackTransport initialization --------- Co-authored-by: Restyled.io <[email protected]>
project-chip · May 14, 2024 · d594086 · d594086
1 parent 3219a5f
commit d594086
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Showing 28 changed files with 191 additions and 197 deletions.
diff --git a/src/app/tests/AppTestContext.h b/src/app/tests/AppTestContext.h
@@ -28,13 +28,13 @@ class AppContext : public LoopbackMessagingContext
 {
 public:
     // Performs shared setup for all tests in the test suite
-    void SetUpTestSuite() override;
+    static void SetUpTestSuite();
     // Performs shared teardown for all tests in the test suite
-    void TearDownTestSuite() override;
+    static void TearDownTestSuite();
     // Performs setup for each individual test in the test suite
-    void SetUp() override;
+    void SetUp();
     // Performs teardown for each individual test in the test suite
-    void TearDown() override;
+    void TearDown();
 };
 
 } // namespace Test

diff --git a/src/app/tests/TestAclAttribute.cpp b/src/app/tests/TestAclAttribute.cpp
@@ -259,10 +259,10 @@ const nlTest sTests[] = {
 nlTestSuite sSuite = {
     "TestAclAttribute",
     &sTests[0],
-    TestAccessContext::nlTestSetUpTestSuite,
-    TestAccessContext::nlTestTearDownTestSuite,
-    TestAccessContext::nlTestSetUp,
-    TestAccessContext::nlTestTearDown,
+    NL_TEST_WRAP_FUNCTION(TestAccessContext::SetUpTestSuite),
+    NL_TEST_WRAP_FUNCTION(TestAccessContext::TearDownTestSuite),
+    NL_TEST_WRAP_METHOD(TestAccessContext, SetUp),
+    NL_TEST_WRAP_METHOD(TestAccessContext, TearDown),
 };
 
 } // namespace

diff --git a/src/app/tests/TestAclEvent.cpp b/src/app/tests/TestAclEvent.cpp
@@ -377,10 +377,10 @@ nlTestSuite sSuite =
 {
     "TestAclEvent",
     &sTests[0],
-    TestContext::nlTestSetUpTestSuite,
-    TestContext::nlTestTearDownTestSuite,
-    TestContext::nlTestSetUp,
-    TestContext::nlTestTearDown,
+    NL_TEST_WRAP_FUNCTION(TestContext::SetUpTestSuite),
+    NL_TEST_WRAP_FUNCTION(TestContext::TearDownTestSuite),
+    NL_TEST_WRAP_METHOD(TestContext, SetUp),
+    NL_TEST_WRAP_METHOD(TestContext, TearDown),
 };
 // clang-format on
 

diff --git a/src/app/tests/TestBufferedReadCallback.cpp b/src/app/tests/TestBufferedReadCallback.cpp
@@ -610,10 +610,10 @@ nlTestSuite theSuite =
 {
     "TestBufferedReadCallback",
     &sTests[0],
-    TestContext::nlTestSetUpTestSuite,
-    TestContext::nlTestTearDownTestSuite,
-    TestContext::nlTestSetUp,
-    TestContext::nlTestTearDown,
+    NL_TEST_WRAP_FUNCTION(TestContext::SetUpTestSuite),
+    NL_TEST_WRAP_FUNCTION(TestContext::TearDownTestSuite),
+    NL_TEST_WRAP_METHOD(TestContext, SetUp),
+    NL_TEST_WRAP_METHOD(TestContext, TearDown),
 };
 
 }

diff --git a/src/app/tests/TestClusterStateCache.cpp b/src/app/tests/TestClusterStateCache.cpp
@@ -695,10 +695,10 @@ nlTestSuite theSuite =
 {
     "TestClusterStateCache",
     &sTests[0],
-    TestContext::nlTestSetUpTestSuite,
-    TestContext::nlTestTearDownTestSuite,
-    TestContext::nlTestSetUp,
-    TestContext::nlTestTearDown,
+    NL_TEST_WRAP_FUNCTION(TestContext::SetUpTestSuite),
+    NL_TEST_WRAP_FUNCTION(TestContext::TearDownTestSuite),
+    NL_TEST_WRAP_METHOD(TestContext, SetUp),
+    NL_TEST_WRAP_METHOD(TestContext, TearDown),
 };
 
 }

diff --git a/src/app/tests/TestCommandInteraction.cpp b/src/app/tests/TestCommandInteraction.cpp
@@ -2120,10 +2120,10 @@ nlTestSuite sSuite =
 {
     "TestCommandInteraction",
     &sTests[0],
-    TestContext::nlTestSetUpTestSuite,
-    TestContext::nlTestTearDownTestSuite,
-    TestContext::nlTestSetUp,
-    TestContext::nlTestTearDown,
+    NL_TEST_WRAP_FUNCTION(TestContext::SetUpTestSuite),
+    NL_TEST_WRAP_FUNCTION(TestContext::TearDownTestSuite),
+    NL_TEST_WRAP_METHOD(TestContext, SetUp),
+    NL_TEST_WRAP_METHOD(TestContext, TearDown),
 };
 // clang-format on
 

diff --git a/src/app/tests/TestEventLogging.cpp b/src/app/tests/TestEventLogging.cpp
@@ -318,10 +318,10 @@ const nlTest sTests[] = {
 nlTestSuite sSuite = {
     "EventLogging",
     &sTests[0],
-    TestContext::nlTestSetUpTestSuite,
-    TestContext::nlTestTearDownTestSuite,
-    TestContext::nlTestSetUp,
-    TestContext::nlTestTearDown,
+    NL_TEST_WRAP_FUNCTION(TestContext::SetUpTestSuite),
+    NL_TEST_WRAP_FUNCTION(TestContext::TearDownTestSuite),
+    NL_TEST_WRAP_METHOD(TestContext, SetUp),
+    NL_TEST_WRAP_METHOD(TestContext, TearDown),
 };
 
 } // namespace

diff --git a/src/app/tests/TestEventLoggingNoUTCTime.cpp b/src/app/tests/TestEventLoggingNoUTCTime.cpp
@@ -84,16 +84,16 @@ class TestContext : public chip::Test::AppContext
 {
 public:
     // Performs shared setup for all tests in the test suite
-    void SetUpTestSuite() override
+    static void SetUpTestSuite()
     {
         chip::Test::AppContext::SetUpTestSuite();
-        mClock.Emplace(chip::System::SystemClock());
+        sClock.Emplace(chip::System::SystemClock());
     }
 
     // Performs shared teardown for all tests in the test suite
-    void TearDownTestSuite() override
+    static void TearDownTestSuite()
     {
-        mClock.ClearValue();
+        sClock.ClearValue();
         chip::Test::AppContext::TearDownTestSuite();
     }
 
@@ -125,9 +125,11 @@ class TestContext : public chip::Test::AppContext
 
 private:
     chip::MonotonicallyIncreasingCounter<chip::EventNumber> mEventCounter;
-    chip::Optional<MockClock> mClock;
+    static chip::Optional<MockClock> sClock;
 };
 
+chip::Optional<MockClock> TestContext::sClock;
+
 void ENFORCE_FORMAT(1, 2) SimpleDumpWriter(const char * aFormat, ...)
 {
     va_list args;
@@ -370,10 +372,10 @@ const nlTest sTests[] = {
 nlTestSuite sSuite = {
     "EventLogging",
     &sTests[0],
-    TestContext::nlTestSetUpTestSuite,
-    TestContext::nlTestTearDownTestSuite,
-    TestContext::nlTestSetUp,
-    TestContext::nlTestTearDown,
+    NL_TEST_WRAP_FUNCTION(TestContext::SetUpTestSuite),
+    NL_TEST_WRAP_FUNCTION(TestContext::TearDownTestSuite),
+    NL_TEST_WRAP_METHOD(TestContext, SetUp),
+    NL_TEST_WRAP_METHOD(TestContext, TearDown),
 };
 
 } // namespace

diff --git a/src/app/tests/TestEventOverflow.cpp b/src/app/tests/TestEventOverflow.cpp
@@ -169,10 +169,10 @@ nlTestSuite sSuite =
 {
     "TestEventOverflow",
     &sTests[0],
-    TestContext::nlTestSetUpTestSuite,
-    TestContext::nlTestTearDownTestSuite,
-    TestContext::nlTestSetUp,
-    TestContext::nlTestTearDown,
+    NL_TEST_WRAP_FUNCTION(TestContext::SetUpTestSuite),
+    NL_TEST_WRAP_FUNCTION(TestContext::TearDownTestSuite),
+    NL_TEST_WRAP_METHOD(TestContext, SetUp),
+    NL_TEST_WRAP_METHOD(TestContext, TearDown),
 };
 // clang-format on
 

diff --git a/src/app/tests/TestFabricScopedEventLogging.cpp b/src/app/tests/TestFabricScopedEventLogging.cpp
@@ -278,10 +278,10 @@ nlTestSuite sSuite =
 {
     "TestFabricScopedEventLogging",
     &sTests[0],
-    TestContext::nlTestSetUpTestSuite,
-    TestContext::nlTestTearDownTestSuite,
-    TestContext::nlTestSetUp,
-    TestContext::nlTestTearDown,
+    NL_TEST_WRAP_FUNCTION(TestContext::SetUpTestSuite),
+    NL_TEST_WRAP_FUNCTION(TestContext::TearDownTestSuite),
+    NL_TEST_WRAP_METHOD(TestContext, SetUp),
+    NL_TEST_WRAP_METHOD(TestContext, TearDown),
 };
 // clang-format on
 

diff --git a/src/app/tests/TestInteractionModelEngine.cpp b/src/app/tests/TestInteractionModelEngine.cpp
@@ -773,10 +773,10 @@ nlTestSuite sSuite =
 {
     "TestInteractionModelEngine",
     &sTests[0],
-    TestContext::nlTestSetUpTestSuite,
-    TestContext::nlTestTearDownTestSuite,
-    TestContext::nlTestSetUp,
-    TestContext::nlTestTearDown,
+    NL_TEST_WRAP_FUNCTION(TestContext::SetUpTestSuite),
+    NL_TEST_WRAP_FUNCTION(TestContext::TearDownTestSuite),
+    NL_TEST_WRAP_METHOD(TestContext, SetUp),
+    NL_TEST_WRAP_METHOD(TestContext, TearDown),
 };
 // clang-format on
 

diff --git a/src/app/tests/TestReadInteraction.cpp b/src/app/tests/TestReadInteraction.cpp
@@ -79,13 +79,13 @@ class TestContext : public chip::Test::AppContext
 {
 public:
     // Performs shared setup for all tests in the test suite
-    void SetUpTestSuite() override
+    static void SetUpTestSuite()
     {
         chip::Test::AppContext::SetUpTestSuite();
         gRealClock = &chip::System::SystemClock();
         chip::System::Clock::Internal::SetSystemClockForTesting(&gMockClock);
 
-        if (mSyncScheduler)
+        if (sSyncScheduler)
         {
             gReportScheduler = chip::app::reporting::GetSynchronizedReportScheduler();
             sUsingSubSync    = true;
@@ -96,14 +96,8 @@ class TestContext : public chip::Test::AppContext
         }
     }
 
-    static int nlTestSetUpTestSuite_Sync(void * context)
-    {
-        static_cast<TestContext *>(context)->mSyncScheduler = true;
-        return nlTestSetUpTestSuite(context);
-    }
-
     // Performs shared teardown for all tests in the test suite
-    void TearDownTestSuite() override
+    static void TearDownTestSuite()
     {
         chip::System::Clock::Internal::SetSystemClockForTesting(gRealClock);
         chip::Test::AppContext::TearDownTestSuite();
@@ -133,9 +127,21 @@ class TestContext : public chip::Test::AppContext
         chip::Test::AppContext::TearDown();
     }
 
-private:
+protected:
     chip::MonotonicallyIncreasingCounter<chip::EventNumber> mEventCounter;
-    bool mSyncScheduler = false;
+    static bool sSyncScheduler;
+};
+
+bool TestContext::sSyncScheduler = false;
+
+class TestSyncContext : public TestContext
+{
+public:
+    static void SetUpTestSuite()
+    {
+        sSyncScheduler = true;
+        TestContext::SetUpTestSuite();
+    }
 };
 
 class TestEventGenerator : public chip::app::EventLoggingDelegate
@@ -5146,19 +5152,19 @@ const nlTest sTests[] = {
 nlTestSuite sSuite = {
     "TestReadInteraction",
     &sTests[0],
-    TestContext::nlTestSetUpTestSuite,
-    TestContext::nlTestTearDownTestSuite,
-    TestContext::nlTestSetUp,
-    TestContext::nlTestTearDown,
+    NL_TEST_WRAP_FUNCTION(TestContext::SetUpTestSuite),
+    NL_TEST_WRAP_FUNCTION(TestContext::TearDownTestSuite),
+    NL_TEST_WRAP_METHOD(TestContext, SetUp),
+    NL_TEST_WRAP_METHOD(TestContext, TearDown),
 };
 
 nlTestSuite sSyncSuite = {
     "TestSyncReadInteraction",
     &sTests[0],
-    TestContext::nlTestSetUpTestSuite_Sync,
-    TestContext::nlTestTearDownTestSuite,
-    TestContext::nlTestSetUp,
-    TestContext::nlTestTearDown,
+    NL_TEST_WRAP_FUNCTION(TestSyncContext::SetUpTestSuite),
+    NL_TEST_WRAP_FUNCTION(TestSyncContext::TearDownTestSuite),
+    NL_TEST_WRAP_METHOD(TestSyncContext, SetUp),
+    NL_TEST_WRAP_METHOD(TestSyncContext, TearDown),
 };
 
 } // namespace

diff --git a/src/app/tests/TestReportScheduler.cpp b/src/app/tests/TestReportScheduler.cpp
@@ -821,10 +821,10 @@ static nlTest sTests[] = {
 nlTestSuite sSuite = {
     "TestReportScheduler",
     &sTests[0],
-    TestContext::nlTestSetUpTestSuite,
-    TestContext::nlTestTearDownTestSuite,
-    TestContext::nlTestSetUp,
-    TestContext::nlTestTearDown,
+    NL_TEST_WRAP_FUNCTION(TestContext::SetUpTestSuite),
+    NL_TEST_WRAP_FUNCTION(TestContext::TearDownTestSuite),
+    NL_TEST_WRAP_METHOD(TestContext, SetUp),
+    NL_TEST_WRAP_METHOD(TestContext, TearDown),
 };
 
 } // namespace

diff --git a/src/app/tests/TestReportingEngine.cpp b/src/app/tests/TestReportingEngine.cpp
@@ -350,10 +350,10 @@ nlTestSuite sSuite =
 {
     "TestReportingEngine",
     &sTests[0],
-    TestContext::nlTestSetUpTestSuite,
-    TestContext::nlTestTearDownTestSuite,
-    TestContext::nlTestSetUp,
-    TestContext::nlTestTearDown,
+    NL_TEST_WRAP_FUNCTION(TestContext::SetUpTestSuite),
+    NL_TEST_WRAP_FUNCTION(TestContext::TearDownTestSuite),
+    NL_TEST_WRAP_METHOD(TestContext, SetUp),
+    NL_TEST_WRAP_METHOD(TestContext, TearDown),
 };
 // clang-format on
 

diff --git a/src/app/tests/TestTimedHandler.cpp b/src/app/tests/TestTimedHandler.cpp
@@ -264,10 +264,10 @@ nlTestSuite sSuite =
 {
     "TestTimedHandler",
     &sTests[0],
-    TestContext::nlTestSetUpTestSuite,
-    TestContext::nlTestTearDownTestSuite,
-    TestContext::nlTestSetUp,
-    TestContext::nlTestTearDown,
+    NL_TEST_WRAP_FUNCTION(TestContext::SetUpTestSuite),
+    NL_TEST_WRAP_FUNCTION(TestContext::TearDownTestSuite),
+    NL_TEST_WRAP_METHOD(TestContext, SetUp),
+    NL_TEST_WRAP_METHOD(TestContext, TearDown),
 };
 // clang-format on
 

diff --git a/src/app/tests/TestWriteInteraction.cpp b/src/app/tests/TestWriteInteraction.cpp
@@ -1063,10 +1063,10 @@ const nlTest sTests[] =
 nlTestSuite sSuite = {
     "TestWriteInteraction",
     &sTests[0],
-    TestContext::nlTestSetUpTestSuite,
-    TestContext::nlTestTearDownTestSuite,
-    TestContext::nlTestSetUp,
-    TestContext::nlTestTearDown,
+    NL_TEST_WRAP_FUNCTION(TestContext::SetUpTestSuite),
+    NL_TEST_WRAP_FUNCTION(TestContext::TearDownTestSuite),
+    NL_TEST_WRAP_METHOD(TestContext, SetUp),
+    NL_TEST_WRAP_METHOD(TestContext, TearDown),
 };
 
 } // namespace

diff --git a/src/lib/support/UnitTestRegistration.h b/src/lib/support/UnitTestRegistration.h
@@ -48,6 +48,20 @@
         VerifyOrDie(chip::RegisterUnitTests(&FUNCTION) == CHIP_NO_ERROR);                                                          \
     }
 
+// TODO: remove these once transition to pw_unit_test is completed
+#define NL_TEST_WRAP_FUNCTION(FUNCTION)                                                                                            \
+    [](void * _context) -> int {                                                                                                   \
+        FUNCTION();                                                                                                                \
+        return SUCCESS;                                                                                                            \
+    }
+
+#define NL_TEST_WRAP_METHOD(CLASS, METHOD)                                                                                         \
+    [](void * context) -> int {                                                                                                    \
+        auto ctx = static_cast<CLASS *>(context);                                                                                  \
+        ctx->METHOD();                                                                                                             \
+        return SUCCESS;                                                                                                            \
+    }
+
 namespace chip {
 
 typedef int (*UnitTestTriggerFunction)();

diff --git a/src/messaging/tests/MessagingContext.cpp b/src/messaging/tests/MessagingContext.cpp
@@ -58,7 +58,7 @@ CHIP_ERROR MessagingContext::Init(TransportMgrBase * transport, IOContext * ioCo
     ReturnErrorOnFailure(mExchangeManager.Init(&mSessionManager));
     ReturnErrorOnFailure(mMessageCounterManager.Init(&mExchangeManager));
 
-    if (mInitializeNodes)
+    if (sInitializeNodes)
     {
         ReturnErrorOnFailure(CreateAliceFabric());
         ReturnErrorOnFailure(CreateBobFabric());
@@ -112,6 +112,8 @@ using namespace System::Clock::Literals;
 constexpr chip::System::Clock::Timeout MessagingContext::kResponsiveIdleRetransTimeout;
 constexpr chip::System::Clock::Timeout MessagingContext::kResponsiveActiveRetransTimeout;
 
+bool MessagingContext::sInitializeNodes = true;
+
 void MessagingContext::SetMRPMode(MRPMode mode)
 {
     if (mode == MRPMode::kDefault)
@@ -302,6 +304,10 @@ Messaging::ExchangeContext * MessagingContext::NewExchangeToBob(Messaging::Excha
     return mExchangeManager.NewContext(GetSessionAliceToBob(), delegate, isInitiator);
 }
 
+LoopbackTransportManager LoopbackMessagingContext::sLoopbackTransportManager;
+
+UDPTransportManager UDPMessagingContext::sUDPTransportManager;
+
 void MessageCapturer::OnMessageReceived(const PacketHeader & packetHeader, const PayloadHeader & payloadHeader,
                                         const SessionHandle & session, DuplicateMessage isDuplicate,
                                         System::PacketBufferHandle && msgBuf)