Test added aug12 (#21862)

* Added updated Manual scripts * Added Auto generated files * Restyled by whitespace * Restyled by clang-format Co-authored-by: Restyled.io <[email protected]>
project-chip · Aug 12, 2022 · 7e6b732 · 7e6b732
1 parent 1a25bbd
commit 7e6b732
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Showing 23 changed files with 956 additions and 610 deletions.
diff --git a/src/app/tests/suites/certification/Test_TC_ACL_2_3.yaml b/src/app/tests/suites/certification/Test_TC_ACL_2_3.yaml
diff --git a/src/app/tests/suites/certification/Test_TC_BOOL_2_2.yaml b/src/app/tests/suites/certification/Test_TC_BOOL_2_2.yaml
@@ -71,7 +71,7 @@ tests:
 
           Subscribe the event using below command in Interactive mode. Once the event occurs, TH get the subscription message.
 
-           booleanstate subscribe-event-by-id 0x0 1 100 2 1
+          booleanstate subscribe-by-id 0x0 1 100 2 1
       disabled: true
 
     - label: "Bring the DUT into a state so StateValue is FALSE"

diff --git a/src/app/tests/suites/certification/Test_TC_BRBINFO_2_3.yaml b/src/app/tests/suites/certification/Test_TC_BRBINFO_2_3.yaml
diff --git a/src/app/tests/suites/certification/Test_TC_CADMIN_1_1.yaml b/src/app/tests/suites/certification/Test_TC_CADMIN_1_1.yaml
@@ -25,6 +25,16 @@ config:
     endpoint: 0
 
 tests:
+    - label: "Note"
+      verification: |
+          For DUT as comissioner  test cases, Chip-tool command used below are an example to verify the functionality. For certification test, we expect DUT should have a capability or way to run the equivalent command.
+      disabled: true
+
+    - label: "Precondition"
+      verification: |
+          Reset Devices to factory defaults
+      disabled: true
+
     - label: "TH_CR1 starts a commissioning process with TH_CE"
       PICS: CADMIN.C
       verification: |
@@ -228,7 +238,7 @@ tests:
           Clusters NodeLabel mandatory attribute"
       PICS: BINFO.C.A0005
       verification: |
-          On TH1 using chip tool, write attribute and read attribute
+          On first controller using chip tool, write attribute and read attribute
 
           ./chip-tool basic write node-label te8 1 0
 
@@ -273,7 +283,7 @@ tests:
           Information Clusters NodeLabel mandatory attribute"
       PICS: BINFO.C.A0005
       verification: |
-          On TH2 using chip-tool read, write attribute and then read attribute to and from TH_CE
+          On 2nd controller using chip-tool read, write attribute and then read attribute to and from TH_CE
 
           Below is an example of using chip tool as controller
 
@@ -325,7 +335,7 @@ tests:
           (Enhanced Commissioning Method)"
       PICS: CADMIN.C.C00.Tx
       verification: |
-          On TH2 open commissioning window using ECM
+          On 2nd controller open commissioning window using ECM
 
           Below is an example when using chip tool as controller
           ./chip-tool pairing open-commissionig-window 2 1 300 1000 3841
@@ -345,7 +355,7 @@ tests:
           using the Revoke Commissioning command"
       PICS: CADMIN.C.C02.Tx
       verification: |
-          On TH2, run revoke command
+          On 2nd controller, run revoke command
 
           Below is an example when using chip tool as controller
 
@@ -389,7 +399,7 @@ tests:
           with TH_CE"
       PICS: CADMIN.C
       verification: |
-          On TH3 using chip-tool connect using manual code generated from 1st controller. This attempt should fail, i.e
+          On 3rd controller using chip-tool connect using manual code generated from 1st controller. This attempt should fail, i.e
 
           ./chip-tool pairing code 1  34995354639
 
@@ -404,7 +414,7 @@ tests:
           Information Clusters NodeLabel mandatory attribute"
       PICS: BINFO.C.A0005
       verification: |
-          On TH2 , write attribute and read attribute to and from TH_CE
+          On 2nd controller , write attribute and read attribute to and from TH_CE
 
           Below is the example using chip tool as controller
 
@@ -450,7 +460,7 @@ tests:
           ECM"
       PICS: CADMIN.C.C00.Tx
       verification: |
-          On TH2 open commissioning window using ECM
+          On 2nd controller open commissioning window using ECM
 
           Below is an example when using chip tool as controller
           ./chip-tool pairing open-commissioning-window 2 1 180 1000 3840
@@ -476,7 +486,7 @@ tests:
           ECM"
       PICS: CADMIN.C.C00.Tx
       verification: |
-          On TH2 open commissioning window using ECM
+          On 2nd controller open commissioning window using ECM
 
           Below is an example when using chip tool as controller
           ./chip-tool pairing open-commissionig-window 2 1 300 1000 3840
@@ -496,7 +506,7 @@ tests:
           from step 15"
       PICS: CADMIN.C
       verification: |
-          On TH1, using chip-tool connect using manual code.
+          On 1st controller, using chip-tool connect using manual code.
 
           Below is the example when using chip tool as controller (considering 34995354639 as the manual code generated by DUT)
           ./chip-tool pairing code 2 34995354639

diff --git a/src/app/tests/suites/certification/Test_TC_CADMIN_1_11.yaml b/src/app/tests/suites/certification/Test_TC_CADMIN_1_11.yaml
@@ -26,6 +26,11 @@ config:
     endpoint: 0
 
 tests:
+    - label: "Precondition"
+      verification: |
+          Reset Devices to factory defaults
+      disabled: true
+
     - label: "TH_CR1 starts a commissioning process with DUT_CE"
       PICS: CADMIN.S
       verification: |
@@ -38,7 +43,7 @@ tests:
           timeout of PIXIT.CADMIN.CwDuration seconds using ECM"
       PICS: CADMIN.S.C00.Rsp
       verification: |
-          On the TH1 using chip tool, open commissioning window using ECM
+          On the 1st controller using chip tool, open commissioning window using ECM
 
 
           ./chip-tool pairing open-commissioning-window 1 1 180 1000 3840
@@ -76,7 +81,7 @@ tests:
     - label: "TH_CR3 Commissions with DUT_CE"
       PICS: CADMIN.S
       verification: |
-          On TH3 using chip tool connect using manual code
+          On 3rd controller using chip tool connect using manual code
 
           ./chip-tool pairing code 3 35484132896
 
@@ -90,7 +95,7 @@ tests:
           Commissions with DUT_CE"
       PICS: CADMIN.S.C00.Rsp
       verification: |
-          On the TH1 using chip tool, open commissioning window using ECM
+          On 1st controller using chip tool, open commissioning window using ECM
 
 
           ./chip-tool pairing open-commissioning-window 1 1 180 1000 3840
@@ -107,7 +112,7 @@ tests:
           [1635874557.417577][4549:4554] CHIP:CTL: SetupQRCode: [MT:00000CQM00AT-F5A510]
 
 
-          On TH2 using chip tool connect using manual code
+          On 2nd controller using chip tool connect using manual code
 
           ./chip-tool pairing code 1 35484132896
 
@@ -120,7 +125,7 @@ tests:
           timeout of PIXIT.CADMIN.CwDuration seconds using ECM"
       PICS: CADMIN.S.C00.Rsp
       verification: |
-          On the TH1 using chip tool, open commissioning window using ECM
+          On 1st controller using chip tool, open commissioning window using ECM
 
 
           ./chip-tool pairing open-commissioning-window 1 1 180 1000 3840
@@ -143,7 +148,7 @@ tests:
           a commissioning timeout of PIXIT.CADMIN.CwDuration seconds using ECM"
       PICS: CADMIN.S.C00.Rsp
       verification: |
-          Before the timer expiry, on the TH1 using chip tool, open commissioning window using ECM. Verify the General code return error 1
+          Before the timer expiry, on the 1st controller using chip tool, open commissioning window using ECM. Verify the General code return error 1
 
 
           ./chip-tool pairing open-commissioning-window 1 1 180 1000 3840
@@ -185,7 +190,7 @@ tests:
     - label: "TH_CR1 reads the list of Fabrics on DUT_CE"
       PICS: OPCREDS.S.A0001
       verification: |
-          On TH1 using chip tool, read fabrics list
+          On 1st controller using chip tool, read fabrics list
 
           ./chip-tool operationalcredentials read fabrics 1 0 --fabric-filtered 0
 
@@ -221,15 +226,15 @@ tests:
           "Wait for the expiration of PIXIT.CADMIN.CwDuration seconds that was
           set in step 6"
       verification: |
-          Wait for the expiration of PIXIT_COMM_WIN seconds
+          verification step to be updated.
       disabled: true
 
     - label:
           "TH_CR1 re-opens a commissioning window on DUT_CE using a
           commissioning timeout of PIXIT.CADMIN.CwDuration seconds using BCM"
       PICS: CADMIN.S.C01.Rsp
       verification: |
-          On the TH1 using chip tool, open commissioning window using BCM
+          On the 1st controller using chip tool, open commissioning window using BCM
 
           ./chip-tool administratorcommissioning open-basic-commissioning-window 500 1 0 --timedInteractionTimeoutMs 1000
 
@@ -284,7 +289,7 @@ tests:
           commissioning timeout of PIXIT.CADMIN.CwDuration seconds using BCM"
       PICS: CADMIN.S.C01.Rsp
       verification: |
-          On the TH3 using chip tool, open commissioning window using BCM before the timer expiry of the above step
+          On the 3rd controller using chip tool, open commissioning window using BCM before the timer expiry of the above step
 
           ./chip-tool administratorcommissioning open-basic-commissioning-window 500 3 0 --timedInteractionTimeoutMs 1000
 
@@ -326,13 +331,13 @@ tests:
           "Wait for the expiration of PIXIT.CADMIN.CwDuration seconds that was
           set in step 11"
       verification: |
-          Wait for the expiration of PIXIT_COMM_WIN seconds
+          verification step to be updated.
       disabled: true
 
     - label: "TH_CR1 reads the list of Fabrics on DUT_CE"
       PICS: OPCREDS.S.A0001
       verification: |
-          On TH1 using chip tool, read fabrics list
+          On 1st controller using chip tool, read fabrics list
 
           ./chip-tool operationalcredentials read fabrics 1 0 --fabric-filtered 0
 
@@ -369,7 +374,7 @@ tests:
           timeout of PIXIT.CADMIN.CwDuration seconds using BCM"
       PICS: CADMIN.S.C01.Rsp
       verification: |
-          On the TH1 using chip tool, open commissioning window using BCM
+          On 1st controller using chip tool, open commissioning window using BCM
 
 
           ./chip-tool administratorcommissioning open-basic-commissioning-window 500 1 0 --timedInteractionTimeoutMs 1000
@@ -414,7 +419,7 @@ tests:
           a commissioning timeout of PIXIT.CADMIN.CwDuration seconds using BCM"
       PICS: CADMIN.S.C01.Rsp
       verification: |
-          On the TH2 using chip tool, open commissioning window using BCM before timer expiry from above step
+          On 2nd controller using chip tool, open commissioning window using BCM before timer expiry from above step
 
           ./chip-tool administratorcommissioning open-basic-commissioning-window 500 2 0 --timedInteractionTimeoutMs 1000
 

diff --git a/src/app/tests/suites/certification/Test_TC_CADMIN_1_12.yaml b/src/app/tests/suites/certification/Test_TC_CADMIN_1_12.yaml
@@ -26,6 +26,16 @@ config:
     endpoint: 0
 
 tests:
+    - label: "Note"
+      verification: |
+          For DUT as comissioner  test cases, Chip-tool command used below are an example to verify the functionality. For certification test, we expect DUT should have a capability or way to run the equivalent command.
+      disabled: true
+
+    - label: "Precondition:"
+      verification: |
+          Reset Devices to factory defaults
+      disabled: true
+
     - label: "DUT_CR1 starts a commissioning process with TH_CE"
       PICS: CADMIN.C
       verification: |
@@ -210,7 +220,7 @@ tests:
           "Wait for the expiration of PIXIT.CADMIN.CwDuration seconds that was
           set in step 4"
       verification: |
-          Wait for the expiration of PIXIT_COMM_WIN seconds
+          verification step to be updated.
       disabled: true
 
     - label:
@@ -349,7 +359,7 @@ tests:
           "Wait for the expiration of PIXIT.CADMIN.CwDuration seconds that was
           set in step 8"
       verification: |
-          Wait for the expiration of PIXIT_COMM_WIN seconds
+          verification step to be updated.
       disabled: true
 
     - label: