Make test setup functions terminate on error (#33002)

* Make test setup functions terminate on error * Restyled by clang-format --------- Co-authored-by: Restyled.io <[email protected]>
project-chip · May 6, 2024 · 3c5b92c · 3c5b92c
1 parent bdd33bd
commit 3c5b92c
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Showing 20 changed files with 113 additions and 146 deletions.
diff --git a/src/app/icd/server/tests/TestICDManager.cpp b/src/app/icd/server/tests/TestICDManager.cpp
@@ -163,7 +163,7 @@ class TestICDManager : public ::testing::Test
             ASSERT_NE(pMessagingContext, nullptr);
         }
 
-        ASSERT_EQ(pMessagingContext->SetUpTestSuite(), CHIP_NO_ERROR);
+        pMessagingContext->SetUpTestSuite();
         ASSERT_EQ(chip::DeviceLayer::PlatformMgr().InitChipStack(), CHIP_NO_ERROR);
 
         DeviceLayer::SetSystemLayerForTesting(&(pMessagingContext->GetSystemLayer()));
@@ -198,7 +198,7 @@ class TestICDManager : public ::testing::Test
     // Performs setup for each individual test in the test suite
     void SetUp() override
     {
-        EXPECT_EQ(pMessagingContext->SetUp(), CHIP_NO_ERROR);
+        pMessagingContext->SetUp();
 
         mICDStateObserver.ResetAll();
         mICDManager.RegisterObserver(&mICDStateObserver);

diff --git a/src/app/tests/AppTestContext.cpp b/src/app/tests/AppTestContext.cpp
@@ -38,15 +38,13 @@ chip::Access::AccessControl gPermissiveAccessControl;
 namespace chip {
 namespace Test {
 
-CHIP_ERROR AppContext::SetUpTestSuite()
+void AppContext::SetUpTestSuite()
 {
     CHIP_ERROR err = CHIP_NO_ERROR;
-    VerifyOrExit((err = LoopbackMessagingContext::SetUpTestSuite()) == CHIP_NO_ERROR,
-                 ChipLogError(AppServer, "SetUpTestSuite lo messaging context failed: %" CHIP_ERROR_FORMAT, err.Format()));
-    VerifyOrExit((err = chip::DeviceLayer::PlatformMgr().InitChipStack()) == CHIP_NO_ERROR,
-                 ChipLogError(AppServer, "Init CHIP stack failed: %" CHIP_ERROR_FORMAT, err.Format()));
-exit:
-    return err;
+    LoopbackMessagingContext::SetUpTestSuite();
+    // TODO: use ASSERT_EQ, once transition to pw_unit_test is complete
+    VerifyOrDieWithMsg((err = chip::DeviceLayer::PlatformMgr().InitChipStack()) == CHIP_NO_ERROR, AppServer,
+                       "Init CHIP stack failed: %" CHIP_ERROR_FORMAT, err.Format());
 }
 
 void AppContext::TearDownTestSuite()
@@ -55,20 +53,19 @@ void AppContext::TearDownTestSuite()
     LoopbackMessagingContext::TearDownTestSuite();
 }
 
-CHIP_ERROR AppContext::SetUp()
+void AppContext::SetUp()
 {
     CHIP_ERROR err = CHIP_NO_ERROR;
-    VerifyOrExit((err = LoopbackMessagingContext::SetUp()) == CHIP_NO_ERROR,
-                 ChipLogError(AppServer, "SetUp lo messaging context failed: %" CHIP_ERROR_FORMAT, err.Format()));
-    VerifyOrExit((err = app::InteractionModelEngine::GetInstance()->Init(
-                      &GetExchangeManager(), &GetFabricTable(), app::reporting::GetDefaultReportScheduler())) == CHIP_NO_ERROR,
-                 ChipLogError(AppServer, "Init InteractionModelEngine failed: %" CHIP_ERROR_FORMAT, err.Format()));
+    LoopbackMessagingContext::SetUp();
+    // TODO: use ASSERT_EQ, once transition to pw_unit_test is complete
+    VerifyOrDieWithMsg((err = app::InteractionModelEngine::GetInstance()->Init(&GetExchangeManager(), &GetFabricTable(),
+                                                                               app::reporting::GetDefaultReportScheduler())) ==
+                           CHIP_NO_ERROR,
+                       AppServer, "Init InteractionModelEngine failed: %" CHIP_ERROR_FORMAT, err.Format());
     Access::SetAccessControl(gPermissiveAccessControl);
-    VerifyOrExit((err = Access::GetAccessControl().Init(chip::Access::Examples::GetPermissiveAccessControlDelegate(),
-                                                        gDeviceTypeResolver)) == CHIP_NO_ERROR,
-                 ChipLogError(AppServer, "Init AccessControl failed: %" CHIP_ERROR_FORMAT, err.Format()));
-exit:
-    return err;
+    VerifyOrDieWithMsg((err = Access::GetAccessControl().Init(chip::Access::Examples::GetPermissiveAccessControlDelegate(),
+                                                              gDeviceTypeResolver)) == CHIP_NO_ERROR,
+                       AppServer, "Init AccessControl failed: %" CHIP_ERROR_FORMAT, err.Format());
 }
 
 void AppContext::TearDown()

diff --git a/src/app/tests/AppTestContext.h b/src/app/tests/AppTestContext.h
@@ -28,11 +28,11 @@ class AppContext : public LoopbackMessagingContext
 {
 public:
     // Performs shared setup for all tests in the test suite
-    CHIP_ERROR SetUpTestSuite() override;
+    void SetUpTestSuite() override;
     // Performs shared teardown for all tests in the test suite
     void TearDownTestSuite() override;
     // Performs setup for each individual test in the test suite
-    CHIP_ERROR SetUp() override;
+    void SetUp() override;
     // Performs teardown for each individual test in the test suite
     void TearDown() override;
 };

diff --git a/src/app/tests/TestAclAttribute.cpp b/src/app/tests/TestAclAttribute.cpp
@@ -81,12 +81,11 @@ class TestAccessContext : public chip::Test::AppContext
 {
 public:
     // Performs setup for each individual test in the test suite
-    CHIP_ERROR SetUp() override
+    void SetUp() override
     {
-        ReturnErrorOnFailure(chip::Test::AppContext::SetUp());
+        chip::Test::AppContext::SetUp();
         Access::GetAccessControl().Finish();
         Access::GetAccessControl().Init(GetTestAccessControlDelegate(), gDeviceTypeResolver);
-        return CHIP_NO_ERROR;
     }
 };
 

diff --git a/src/app/tests/TestAclEvent.cpp b/src/app/tests/TestAclEvent.cpp
@@ -86,27 +86,25 @@ class TestContext : public chip::Test::AppContext
 {
 public:
     // Performs setup for each individual test in the test suite
-    CHIP_ERROR SetUp() override
+    void SetUp() override
     {
         const chip::app::LogStorageResources logStorageResources[] = {
             { &gDebugEventBuffer[0], sizeof(gDebugEventBuffer), chip::app::PriorityLevel::Debug },
             { &gInfoEventBuffer[0], sizeof(gInfoEventBuffer), chip::app::PriorityLevel::Info },
             { &gCritEventBuffer[0], sizeof(gCritEventBuffer), chip::app::PriorityLevel::Critical },
         };
 
-        ReturnErrorOnFailure(chip::Test::AppContext::SetUp());
+        chip::Test::AppContext::SetUp();
 
         CHIP_ERROR err = CHIP_NO_ERROR;
-        VerifyOrExit((err = mEventCounter.Init(0)) == CHIP_NO_ERROR,
-                     ChipLogError(AppServer, "Init EventCounter failed: %" CHIP_ERROR_FORMAT, err.Format()));
+        // TODO: use ASSERT_EQ, once transition to pw_unit_test is complete
+        VerifyOrDieWithMsg((err = mEventCounter.Init(0)) == CHIP_NO_ERROR, AppServer,
+                           "Init EventCounter failed: %" CHIP_ERROR_FORMAT, err.Format());
         chip::app::EventManagement::CreateEventManagement(&GetExchangeManager(), ArraySize(logStorageResources),
                                                           gCircularEventBuffer, logStorageResources, &mEventCounter);
 
         Access::GetAccessControl().Finish();
         Access::GetAccessControl().Init(GetTestAccessControlDelegate(), gDeviceTypeResolver);
-
-    exit:
-        return err;
     }
 
     // Performs teardown for each individual test in the test suite

diff --git a/src/app/tests/TestEventLogging.cpp b/src/app/tests/TestEventLogging.cpp
@@ -64,24 +64,22 @@ class TestContext : public chip::Test::AppContext
 {
 public:
     // Performs setup for each individual test in the test suite
-    CHIP_ERROR SetUp() override
+    void SetUp() override
     {
         const chip::app::LogStorageResources logStorageResources[] = {
             { &gDebugEventBuffer[0], sizeof(gDebugEventBuffer), chip::app::PriorityLevel::Debug },
             { &gInfoEventBuffer[0], sizeof(gInfoEventBuffer), chip::app::PriorityLevel::Info },
             { &gCritEventBuffer[0], sizeof(gCritEventBuffer), chip::app::PriorityLevel::Critical },
         };
 
-        ReturnErrorOnFailure(chip::Test::AppContext::SetUp());
+        chip::Test::AppContext::SetUp();
 
         CHIP_ERROR err = CHIP_NO_ERROR;
-        VerifyOrExit((err = mEventCounter.Init(0)) == CHIP_NO_ERROR,
-                     ChipLogError(AppServer, "Init EventCounter failed: %" CHIP_ERROR_FORMAT, err.Format()));
+        // TODO: use ASSERT_EQ, once transition to pw_unit_test is complete
+        VerifyOrDieWithMsg((err = mEventCounter.Init(0)) == CHIP_NO_ERROR, AppServer,
+                           "Init EventCounter failed: %" CHIP_ERROR_FORMAT, err.Format());
         chip::app::EventManagement::CreateEventManagement(&GetExchangeManager(), ArraySize(logStorageResources),
                                                           gCircularEventBuffer, logStorageResources, &mEventCounter);
-
-    exit:
-        return err;
     }
 
     // Performs teardown for each individual test in the test suite

diff --git a/src/app/tests/TestEventLoggingNoUTCTime.cpp b/src/app/tests/TestEventLoggingNoUTCTime.cpp
@@ -84,11 +84,10 @@ class TestContext : public chip::Test::AppContext
 {
 public:
     // Performs shared setup for all tests in the test suite
-    CHIP_ERROR SetUpTestSuite() override
+    void SetUpTestSuite() override
     {
-        ReturnErrorOnFailure(chip::Test::AppContext::SetUpTestSuite());
+        chip::Test::AppContext::SetUpTestSuite();
         mClock.Emplace(chip::System::SystemClock());
-        return CHIP_NO_ERROR;
     }
 
     // Performs shared teardown for all tests in the test suite
@@ -99,24 +98,22 @@ class TestContext : public chip::Test::AppContext
     }
 
     // Performs setup for each individual test in the test suite
-    CHIP_ERROR SetUp() override
+    void SetUp() override
     {
         const chip::app::LogStorageResources logStorageResources[] = {
             { &gDebugEventBuffer[0], sizeof(gDebugEventBuffer), chip::app::PriorityLevel::Debug },
             { &gInfoEventBuffer[0], sizeof(gInfoEventBuffer), chip::app::PriorityLevel::Info },
             { &gCritEventBuffer[0], sizeof(gCritEventBuffer), chip::app::PriorityLevel::Critical },
         };
 
-        ReturnErrorOnFailure(chip::Test::AppContext::SetUp());
+        chip::Test::AppContext::SetUp();
 
         CHIP_ERROR err = CHIP_NO_ERROR;
-        VerifyOrExit((err = mEventCounter.Init(0)) == CHIP_NO_ERROR,
-                     ChipLogError(AppServer, "Init EventCounter failed: %" CHIP_ERROR_FORMAT, err.Format()));
+        // TODO: use ASSERT_EQ, once transition to pw_unit_test is complete
+        VerifyOrDieWithMsg((err = mEventCounter.Init(0)) == CHIP_NO_ERROR, AppServer,
+                           "Init EventCounter failed: %" CHIP_ERROR_FORMAT, err.Format());
         chip::app::EventManagement::CreateEventManagement(&GetExchangeManager(), ArraySize(logStorageResources),
                                                           gCircularEventBuffer, logStorageResources, &mEventCounter);
-
-    exit:
-        return err;
     }
 
     // Performs teardown for each individual test in the test suite

diff --git a/src/app/tests/TestEventOverflow.cpp b/src/app/tests/TestEventOverflow.cpp
@@ -56,24 +56,22 @@ class TestContext : public chip::Test::AppContext
 {
 public:
     // Performs setup for each individual test in the test suite
-    CHIP_ERROR SetUp() override
+    void SetUp() override
     {
         const chip::app::LogStorageResources logStorageResources[] = {
             { &gDebugEventBuffer[0], sizeof(gDebugEventBuffer), chip::app::PriorityLevel::Debug },
             { &gInfoEventBuffer[0], sizeof(gInfoEventBuffer), chip::app::PriorityLevel::Info },
             { &gCritEventBuffer[0], sizeof(gCritEventBuffer), chip::app::PriorityLevel::Critical },
         };
 
-        ReturnErrorOnFailure(chip::Test::AppContext::SetUp());
+        chip::Test::AppContext::SetUp();
 
         CHIP_ERROR err = CHIP_NO_ERROR;
-        VerifyOrExit((err = mEventCounter.Init(0)) == CHIP_NO_ERROR,
-                     ChipLogError(AppServer, "Init EventCounter failed: %" CHIP_ERROR_FORMAT, err.Format()));
+        // TODO: use ASSERT_EQ, once transition to pw_unit_test is complete
+        VerifyOrDieWithMsg((err = mEventCounter.Init(0)) == CHIP_NO_ERROR, AppServer,
+                           "Init EventCounter failed: %" CHIP_ERROR_FORMAT, err.Format());
         chip::app::EventManagement::CreateEventManagement(&GetExchangeManager(), ArraySize(logStorageResources),
                                                           gCircularEventBuffer, logStorageResources, &mEventCounter);
-
-    exit:
-        return err;
     }
 
     // Performs teardown for each individual test in the test suite

diff --git a/src/app/tests/TestFabricScopedEventLogging.cpp b/src/app/tests/TestFabricScopedEventLogging.cpp
@@ -64,24 +64,22 @@ class TestContext : public chip::Test::AppContext
 {
 public:
     // Performs setup for each individual test in the test suite
-    CHIP_ERROR SetUp() override
+    void SetUp() override
     {
         const chip::app::LogStorageResources logStorageResources[] = {
             { &gDebugEventBuffer[0], sizeof(gDebugEventBuffer), chip::app::PriorityLevel::Debug },
             { &gInfoEventBuffer[0], sizeof(gInfoEventBuffer), chip::app::PriorityLevel::Info },
             { &gCritEventBuffer[0], sizeof(gCritEventBuffer), chip::app::PriorityLevel::Critical },
         };
 
-        ReturnErrorOnFailure(chip::Test::AppContext::SetUp());
+        chip::Test::AppContext::SetUp();
 
         CHIP_ERROR err = CHIP_NO_ERROR;
-        VerifyOrExit((err = mEventCounter.Init(0)) == CHIP_NO_ERROR,
-                     ChipLogError(AppServer, "Init EventCounter failed: %" CHIP_ERROR_FORMAT, err.Format()));
+        // TODO: use ASSERT_EQ, once transition to pw_unit_test is complete
+        VerifyOrDieWithMsg((err = mEventCounter.Init(0)) == CHIP_NO_ERROR, AppServer,
+                           "Init EventCounter failed: %" CHIP_ERROR_FORMAT, err.Format());
         chip::app::EventManagement::CreateEventManagement(&GetExchangeManager(), ArraySize(logStorageResources),
                                                           gCircularEventBuffer, logStorageResources, &mEventCounter);
-
-    exit:
-        return err;
     }
 
     // Performs teardown for each individual test in the test suite

diff --git a/src/app/tests/TestReadInteraction.cpp b/src/app/tests/TestReadInteraction.cpp
@@ -79,9 +79,9 @@ class TestContext : public chip::Test::AppContext
 {
 public:
     // Performs shared setup for all tests in the test suite
-    CHIP_ERROR SetUpTestSuite() override
+    void SetUpTestSuite() override
     {
-        ReturnErrorOnFailure(chip::Test::AppContext::SetUpTestSuite());
+        chip::Test::AppContext::SetUpTestSuite();
         gRealClock = &chip::System::SystemClock();
         chip::System::Clock::Internal::SetSystemClockForTesting(&gMockClock);
 
@@ -94,8 +94,6 @@ class TestContext : public chip::Test::AppContext
         {
             gReportScheduler = chip::app::reporting::GetDefaultReportScheduler();
         }
-
-        return CHIP_NO_ERROR;
     }
 
     static int nlTestSetUpTestSuite_Sync(void * context)
@@ -112,24 +110,20 @@ class TestContext : public chip::Test::AppContext
     }
 
     // Performs setup for each individual test in the test suite
-    CHIP_ERROR SetUp() override
+    void SetUp() override
     {
         const chip::app::LogStorageResources logStorageResources[] = {
             { &gDebugEventBuffer[0], sizeof(gDebugEventBuffer), chip::app::PriorityLevel::Debug },
             { &gInfoEventBuffer[0], sizeof(gInfoEventBuffer), chip::app::PriorityLevel::Info },
             { &gCritEventBuffer[0], sizeof(gCritEventBuffer), chip::app::PriorityLevel::Critical },
         };
 
-        ReturnErrorOnFailure(chip::Test::AppContext::SetUp());
+        chip::Test::AppContext::SetUp();
 
-        CHIP_ERROR err = CHIP_NO_ERROR;
-        VerifyOrExit((err = mEventCounter.Init(0)) == CHIP_NO_ERROR,
-                     ChipLogError(AppServer, "Init EventCounter failed: %" CHIP_ERROR_FORMAT, err.Format()));
+        // TODO: change to ASSERT_EQ, once transition to pw_unit_test is complete
+        VerifyOrDie(mEventCounter.Init(0) == CHIP_NO_ERROR);
         chip::app::EventManagement::CreateEventManagement(&GetExchangeManager(), ArraySize(logStorageResources),
                                                           gCircularEventBuffer, logStorageResources, &mEventCounter);
-
-    exit:
-        return err;
     }
 
     // Performs teardown for each individual test in the test suite

diff --git a/src/app/tests/TestWriteInteraction.cpp b/src/app/tests/TestWriteInteraction.cpp
@@ -55,22 +55,21 @@ class TestContext : public chip::Test::AppContext
 {
 public:
     // Performs setup for each individual test in the test suite
-    CHIP_ERROR SetUp() override
+    void SetUp() override
     {
-        ReturnErrorOnFailure(chip::Test::AppContext::SetUp());
+        chip::Test::AppContext::SetUp();
 
         gTestStorage.ClearStorage();
         gGroupsProvider.SetStorageDelegate(&gTestStorage);
         gGroupsProvider.SetSessionKeystore(&gSessionKeystore);
-        ReturnErrorOnFailure(gGroupsProvider.Init());
+        // TODO: use ASSERT_EQ, once transition to pw_unit_test is complete
+        VerifyOrDie(gGroupsProvider.Init() == CHIP_NO_ERROR);
         chip::Credentials::SetGroupDataProvider(&gGroupsProvider);
 
         uint8_t buf[sizeof(chip::CompressedFabricId)];
         chip::MutableByteSpan span(buf);
-        ReturnErrorOnFailure(GetBobFabric()->GetCompressedFabricIdBytes(span));
-        ReturnErrorOnFailure(chip::GroupTesting::InitData(&gGroupsProvider, GetBobFabricIndex(), span));
-
-        return CHIP_NO_ERROR;
+        VerifyOrDie(GetBobFabric()->GetCompressedFabricIdBytes(span) == CHIP_NO_ERROR);
+        VerifyOrDie(chip::GroupTesting::InitData(&gGroupsProvider, GetBobFabricIndex(), span) == CHIP_NO_ERROR);
     }
 
     // Performs teardown for each individual test in the test suite

diff --git a/src/controller/tests/TestEventCaching.cpp b/src/controller/tests/TestEventCaching.cpp
@@ -56,24 +56,22 @@ class TestContext : public chip::Test::AppContext
 {
 public:
     // Performs setup for each individual test in the test suite
-    CHIP_ERROR SetUp() override
+    void SetUp() override
     {
         const chip::app::LogStorageResources logStorageResources[] = {
             { &gDebugEventBuffer[0], sizeof(gDebugEventBuffer), chip::app::PriorityLevel::Debug },
             { &gInfoEventBuffer[0], sizeof(gInfoEventBuffer), chip::app::PriorityLevel::Info },
             { &gCritEventBuffer[0], sizeof(gCritEventBuffer), chip::app::PriorityLevel::Critical },
         };
 
-        ReturnErrorOnFailure(chip::Test::AppContext::SetUp());
+        chip::Test::AppContext::SetUp();
 
         CHIP_ERROR err = CHIP_NO_ERROR;
-        VerifyOrExit((err = mEventCounter.Init(0)) == CHIP_NO_ERROR,
-                     ChipLogError(AppServer, "Init EventCounter failed: %" CHIP_ERROR_FORMAT, err.Format()));
+        // TODO: use ASSERT_EQ, once transition to pw_unit_test is complete
+        VerifyOrDieWithMsg((err = mEventCounter.Init(0)) == CHIP_NO_ERROR, AppServer,
+                           "Init EventCounter failed: %" CHIP_ERROR_FORMAT, err.Format());
         chip::app::EventManagement::CreateEventManagement(&GetExchangeManager(), ArraySize(logStorageResources),
                                                           gCircularEventBuffer, logStorageResources, &mEventCounter);
-
-    exit:
-        return err;
     }
 
     // Performs teardown for each individual test in the test suite