[ICD] Convert TestICDMonitoringTable to gTest (#33239)

* Move tests to icd/server/tests

* Remove App dependency from the TestICDManager and build it on its own

* Convert TestICDMonitoringTable to gtest

* Fix build and address review comments

* Add define guards in case some builds dont use TCP / UDP endpoints

src/BUILD.gn

@@ -66,6 +66,8 @@ if (chip_build_tests) {
       "${chip_root}/src/protocols/interaction_model/tests",
       "${chip_root}/src/protocols/user_directed_commissioning/tests",
       "${chip_root}/src/transport/retransmit/tests",
+      "${chip_root}/src/app/icd/server/tests",
+      "${chip_root}/src/app/icd/server/tests:tests_nltest",
     ]
 
     # Skip DNSSD tests for Mbed platform due to flash memory size limitations

src/app/icd/server/tests/BUILD.gn

@@ -0,0 +1,50 @@
+# Copyright (c) 2024 Project CHIP Authors
+#
+# Licensed under the Apache License, Version 2.0 (the "License");
+# you may not use this file except in compliance with the License.
+# You may obtain a copy of the License at
+#
+# http://www.apache.org/licenses/LICENSE-2.0
+#
+# Unless required by applicable law or agreed to in writing, software
+# distributed under the License is distributed on an "AS IS" BASIS,
+# WITHOUT WARRANTIES OR CONDITIONS OF ANY KIND, either express or implied.
+# See the License for the specific language governing permissions and
+# limitations under the License.
+
+import("//build_overrides/build.gni")
+import("//build_overrides/chip.gni")
+import("//build_overrides/nlunit_test.gni")
+import("//build_overrides/pigweed.gni")
+import("${chip_root}/build/chip/chip_test_suite.gni")
+import("${chip_root}/src/app/icd/icd.gni")
+
+chip_test_suite_using_nltest("tests_nltest") {
+  output_name = "libICDServerTestsNL"
+
+  test_sources = [ "TestICDManager.cpp" ]
+
+  public_deps = [
+    "${chip_root}/src/app/icd/server:manager",
+    "${chip_root}/src/app/icd/server:monitoring-table",
+    "${chip_root}/src/lib/support:test_utils",
+    "${chip_root}/src/lib/support:testing",
+    "${chip_root}/src/lib/support:testing_nlunit",
+    "${chip_root}/src/messaging/tests:helpers",
+    "${nlunit_test_root}:nlunit-test",
+  ]
+}
+
+chip_test_suite("tests") {
+  output_name = "libICDServerTests"
+
+  test_sources = [ "TestICDMonitoringTable.cpp" ]
+
+  public_deps = [
+    "${chip_root}/src/app/icd/server:monitoring-table",
+    "${chip_root}/src/lib/support:test_utils",
+    "${chip_root}/src/lib/support:testing",
+  ]
+
+  cflags = [ "-Wconversion" ]
+}

src/app/tests/TestICDManager.cpp → src/app/icd/server/tests/TestICDManager.cpp

@@ -15,26 +15,25 @@
  *    See the License for the specific language governing permissions and
  *    limitations under the License.
  */
-#include <app/EventManagement.h>
 #include <app/SubscriptionsInfoProvider.h>
 #include <app/TestEventTriggerDelegate.h>
 #include <app/icd/server/ICDConfigurationData.h>
 #include <app/icd/server/ICDManager.h>
+#include <app/icd/server/ICDMonitoringTable.h>
 #include <app/icd/server/ICDNotifier.h>
 #include <app/icd/server/ICDStateObserver.h>
-#include <app/tests/AppTestContext.h>
+#include <crypto/DefaultSessionKeystore.h>
 #include <lib/core/DataModelTypes.h>
 #include <lib/core/NodeId.h>
 #include <lib/support/TestPersistentStorageDelegate.h>
 #include <lib/support/TimeUtils.h>
 #include <lib/support/UnitTestContext.h>
 #include <lib/support/UnitTestExtendedAssertions.h>
 #include <lib/support/UnitTestRegistration.h>
+#include <messaging/tests/MessagingContext.h>
 #include <nlunit-test.h>
 #include <system/SystemLayerImpl.h>
 
-#include <crypto/DefaultSessionKeystore.h>
-
 using namespace chip;
 using namespace chip::app;
 using namespace chip::System;
@@ -119,16 +118,19 @@ class TestSubscriptionsInfoProvider : public SubscriptionsInfoProvider
     bool mHasPersistedSubscription = false;
 };
 
-class TestContext : public chip::Test::AppContext
+class TestContext : public chip::Test::LoopbackMessagingContext
 {
 public:
     // Performs shared setup for all tests in the test suite
     CHIP_ERROR SetUpTestSuite() override
     {
-        ReturnErrorOnFailure(chip::Test::AppContext::SetUpTestSuite());
+        ReturnErrorOnFailure(LoopbackMessagingContext::SetUpTestSuite());
+        ReturnErrorOnFailure(chip::DeviceLayer::PlatformMgr().InitChipStack());
+
         DeviceLayer::SetSystemLayerForTesting(&GetSystemLayer());
         mRealClock = &chip::System::SystemClock();
         System::Clock::Internal::SetSystemClockForTesting(&mMockClock);
+
         return CHIP_NO_ERROR;
     }
 
@@ -137,24 +139,28 @@ class TestContext : public chip::Test::AppContext
     {
         System::Clock::Internal::SetSystemClockForTesting(mRealClock);
         DeviceLayer::SetSystemLayerForTesting(nullptr);
-        chip::Test::AppContext::TearDownTestSuite();
+
+        chip::DeviceLayer::PlatformMgr().Shutdown();
+        LoopbackMessagingContext::TearDownTestSuite();
     }
 
     // Performs setup for each individual test in the test suite
     CHIP_ERROR SetUp() override
     {
-        ReturnErrorOnFailure(chip::Test::AppContext::SetUp());
+        ReturnErrorOnFailure(LoopbackMessagingContext::SetUp());
+
         mICDStateObserver.ResetAll();
         mICDManager.RegisterObserver(&mICDStateObserver);
         mICDManager.Init(&testStorage, &GetFabricTable(), &mKeystore, &GetExchangeManager(), &mSubInfoProvider);
+
         return CHIP_NO_ERROR;
     }
 
     // Performs teardown for each individual test in the test suite
     void TearDown() override
     {
         mICDManager.Shutdown();
-        chip::Test::AppContext::TearDown();
+        LoopbackMessagingContext::TearDown();
     }
 
     System::Clock::Internal::MockClock mMockClock;
@@ -653,6 +659,7 @@ class TestICDManager
         NL_TEST_ASSERT(aSuite, stayActivePromisedMs == 20000);
     }
 
+#if CHIP_CONFIG_ENABLE_ICD_CIP
 #if CHIP_CONFIG_PERSIST_SUBSCRIPTIONS
 #if CHIP_CONFIG_SUBSCRIPTION_TIMEOUT_RESUMPTION
     static void TestShouldCheckInMsgsBeSentAtActiveModeFunction(nlTestSuite * aSuite, void * aContext)
@@ -723,6 +730,7 @@ class TestICDManager
         NL_TEST_ASSERT(aSuite, ctx->mICDManager.ShouldCheckInMsgsBeSentAtActiveModeFunction(kTestFabricIndex1, kClientNodeId11));
     }
 #endif // CHIP_CONFIG_PERSIST_SUBSCRIPTIONS
+#endif // CHIP_CONFIG_ENABLE_ICD_CIP
 
     static void TestHandleTestEventTriggerActiveModeReq(nlTestSuite * aSuite, void * aContext)
     {
@@ -1117,27 +1125,29 @@ namespace {
 static const nlTest sTests[] = {
     NL_TEST_DEF("TestICDModeDurations", TestICDManager::TestICDModeDurations),
     NL_TEST_DEF("TestOnSubscriptionReport", TestICDManager::TestOnSubscriptionReport),
-    NL_TEST_DEF("TestICDModeDurationsWith0ActiveModeDurationWithoutActiveSub",
-                TestICDManager::TestICDModeDurationsWith0ActiveModeDurationWithoutActiveSub),
-    NL_TEST_DEF("TestICDModeDurationsWith0ActiveModeDurationWithActiveSub",
-                TestICDManager::TestICDModeDurationsWith0ActiveModeDurationWithActiveSub),
     NL_TEST_DEF("TestKeepActivemodeRequests", TestICDManager::TestKeepActivemodeRequests),
-    NL_TEST_DEF("TestICDMRegisterUnregisterEvents", TestICDManager::TestICDMRegisterUnregisterEvents),
-    NL_TEST_DEF("TestICDCounter", TestICDManager::TestICDCounter),
     NL_TEST_DEF("TestICDStayActive", TestICDManager::TestICDMStayActive),
+#if CHIP_CONFIG_ENABLE_ICD_CIP
+    NL_TEST_DEF("TestICDCounter", TestICDManager::TestICDCounter),
+    NL_TEST_DEF("TestICDMRegisterUnregisterEvents", TestICDManager::TestICDMRegisterUnregisterEvents),
+    NL_TEST_DEF("TestICDModeDurationsWith0ActiveModeDurationWithActiveSub",
+                TestICDManager::TestICDModeDurationsWith0ActiveModeDurationWithActiveSub),
+    NL_TEST_DEF("TestICDModeDurationsWith0ActiveModeDurationWithoutActiveSub",
+                TestICDManager::TestICDModeDurationsWith0ActiveModeDurationWithoutActiveSub),
     NL_TEST_DEF("TestShouldCheckInMsgsBeSentAtActiveModeFunction", TestICDManager::TestShouldCheckInMsgsBeSentAtActiveModeFunction),
-    NL_TEST_DEF("TestHandleTestEventTriggerActiveModeReq", TestICDManager::TestHandleTestEventTriggerActiveModeReq),
     NL_TEST_DEF("TestHandleTestEventTriggerInvalidateHalfCounterValues",
                 TestICDManager::TestHandleTestEventTriggerInvalidateHalfCounterValues),
     NL_TEST_DEF("TestHandleTestEventTriggerInvalidateAllCounterValues",
                 TestICDManager::TestHandleTestEventTriggerInvalidateAllCounterValues),
+    NL_TEST_DEF("TestICDStateObserverOnICDModeChange", TestICDManager::TestICDStateObserverOnICDModeChange),
+    NL_TEST_DEF("TestICDStateObserverOnICDModeChangeOnInit", TestICDManager::TestICDStateObserverOnICDModeChangeOnInit),
+#endif // CHIP_CONFIG_ENABLE_ICD_CIP
+    NL_TEST_DEF("TestHandleTestEventTriggerActiveModeReq", TestICDManager::TestHandleTestEventTriggerActiveModeReq),
     NL_TEST_DEF("TestICDStateObserverOnEnterIdleModeActiveModeDuration",
                 TestICDManager::TestICDStateObserverOnEnterIdleModeActiveModeDuration),
     NL_TEST_DEF("TestICDStateObserverOnEnterIdleModeActiveModeThreshold",
                 TestICDManager::TestICDStateObserverOnEnterIdleModeActiveModeThreshold),
     NL_TEST_DEF("TestICDStateObserverOnEnterActiveMode", TestICDManager::TestICDStateObserverOnEnterActiveMode),
-    NL_TEST_DEF("TestICDStateObserverOnICDModeChange", TestICDManager::TestICDStateObserverOnICDModeChange),
-    NL_TEST_DEF("TestICDStateObserverOnICDModeChangeOnInit", TestICDManager::TestICDStateObserverOnICDModeChangeOnInit),
     NL_TEST_DEF("TestICDStateObserverOnTransitionToIdleModeGreaterActiveModeDuration",
                 TestICDManager::TestICDStateObserverOnTransitionToIdleModeGreaterActiveModeDuration),
     NL_TEST_DEF("TestICDStateObserverOnTransitionToIdleModeEqualActiveModeDuration",