Device Attestation helpers #3
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added 3 commits
August 19, 2021 17:55
TestAKID_x509Extraction TestVID_x509Extraction TestAttestationElements_Construction
| @@ -169,6 +169,43 @@ CHIP_ERROR GetTestCertPubkey(uint8_t certType, const uint8_t ** certPubkey, uint | |||
| return err; | |||
| } | |||
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| CHIP_ERROR GetTestCertAKID(uint8_t certType, ByteSpan & akid) | |||
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This really seems like it would be much more scalable to have a utility to obtain the AKID/SKID. Not for this PR, but to be considered...
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Problem
Support for Device Attestation PR
Change overview
May want to remove P256Keypair::ECDSA_sign_attestation_data since it may be redundant from Tennessee's examples/
I also want to squash the commits.
Testing
Matter unit tests