[pinmux] Remove some TODOs #6025
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This does not seem to be necessary anymore. Signed-off-by: Michael Schaffner <[email protected]>
This slightly modifies the strap sampling behavior in DFT-enabled LC states. In particular, we now continously sample the straps in those states, instead of gating the continous sampling mode on whether the initial sample was nonzero or not. This puts less burden on the emulation and simulation environments where it the device can run in a DFT-enabled mode, since the strap values may be changed arbitrarily during the test sequence. This also changes the default life cycle state to RMA instead of DEV for simulation and emulation environments to ungate all debug infrastructure and functional modes. Signed-off-by: Michael Schaffner <[email protected]>
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The first commit removes a tie-off array that is not needed anymore.
The second commit updates the strap sampling behavior in DFT-enabled LC states.
We also change the life cycle state for emulation and simulation environments from DEV to RMA in order to ungate all possible DFT and functional infrastructure.