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Feature: Simulatenous drivers testing #57
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@mray19027 , can you comment on the feasibility of adding this? |
Pretty easy to do. Just would involve combining the existing EEPROM and SDCard tests. Biggest problem I can see with this would be timing. We would have to make sure the data streams for both I2C/SPI are big enough to ensure that both are actually running at the same time. CI Test shield tests already are verifying the simultaneous usage of DigitalIn/Out with InterruptIn as the interrupts are required for the tests. |
Yeah, I think this is a good idea too. The question is where does this fall into the certification program? Should we require this testing for a device to be mbed certified? Should this be tested in all level's of our level testing scheme? Also as an aside note, I think that the UART testing should be expanded, because we are only really testing the UART block that is connected to the USB port when running greentea. For a more robust testing, we should really be testing all the UART hardware blocks specified in PeripheralPins.c. |
In current tests we would add this as a new test group called simultaneous. So we would have In level testing this would go into the corner case testing of the last level. Not required for certification, but reccomended to run. @screamerbg what do you think? |
@screamerbg - implementation of this feature is in PR #62 Can you review the code in that PR to verify that is what you were requesting? |
## Features: 2 features added: PWM separation and concurrent testing ### PWM separation Some MCUs do not have the ability to have rising and falling edge PWM triggers. We separated the PWM test into 3 separate tests: - Rising triggers - Falling triggers - Rising and falling triggers Test results now report when a specific trigger fails ### Concurrent tests Tests were designed to test specific implementations of mbed OS APIs. We added 3 additional tests to verify that crossover between APIs does not interfere. We test the following tests concurrently: - Communication APIs: Mixes SPI and I2C devices - GPI APIs: Mixes analog in/out, interrupt in, and digital in/out - Mixed APIs: Combines everything ### Feature requests Feature requests originally brought up here: - PWM separation: PR #58 - Concurrent tests: PR #57
It would be great if the CI test shield tests are verifying the simultaneous use of mbed OS driver APIs:
** Simultaneous use in a single thread
** Simultaneous use in multiple threads
Printing the tests output would effectively test the simultaneous use of UART as well.
@BlackstoneEngineering @mbartling @bridadan @sg-
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