From 4ca07bf94d95f77e9100e8289518ec6c6a509f68 Mon Sep 17 00:00:00 2001
From: Jakub Latusek <j.latusek@samsung.com>
Date: Mon, 20 May 2024 17:00:07 +0200
Subject: [PATCH] Test changing an order of tests execution

---
 src/test_driver/nrfconnect/main/runner.cpp | 3 ++-
 1 file changed, 2 insertions(+), 1 deletion(-)

diff --git a/src/test_driver/nrfconnect/main/runner.cpp b/src/test_driver/nrfconnect/main/runner.cpp
index 1cd57d0bbbd406..d779f1d5300d09 100644
--- a/src/test_driver/nrfconnect/main/runner.cpp
+++ b/src/test_driver/nrfconnect/main/runner.cpp
@@ -35,8 +35,9 @@ extern "C" int main(void)
     VerifyOrDie(settings_subsys_init() == 0);
 
     LOG_INF("Starting CHIP tests!");
-    int status = RunRegisteredUnitTests();
+    int status = 0;
     status += chip::test::RunAllTests();
+    status += RunRegisteredUnitTests();
     LOG_INF("CHIP test status: %d", status);
 
     _exit(status);