From 2d4cca0a82dbf2e9ca11f3cb59cbf8147b75677a Mon Sep 17 00:00:00 2001
From: William Hicklin <william.hicklin@dyson.com>
Date: Fri, 7 Jul 2023 06:23:37 +0100
Subject: [PATCH] Removed the failure on init test as it may have been causing
 seg faults in some tests.

---
 src/app/tests/TestAttributePersistenceProvider.cpp | 10 +++-------
 1 file changed, 3 insertions(+), 7 deletions(-)

diff --git a/src/app/tests/TestAttributePersistenceProvider.cpp b/src/app/tests/TestAttributePersistenceProvider.cpp
index c451dc648422dd..9a19a725ffd75b 100644
--- a/src/app/tests/TestAttributePersistenceProvider.cpp
+++ b/src/app/tests/TestAttributePersistenceProvider.cpp
@@ -63,17 +63,13 @@ void TestStorageAndRetrivalByteSpans(nlTestSuite * inSuite, void * inContext)
     TestPersistentStorageDelegate storageDelegate;
     DefaultAttributePersistenceProvider persistenceProvider;
 
-    // Failure before Init
-    uint8_t valueArray[1] = { 0x42 };
-    ByteSpan value(valueArray);
-    CHIP_ERROR err = persistenceProvider.WriteValue(TestConcretePath, value);
-    NL_TEST_ASSERT(inSuite, err == CHIP_ERROR_INCORRECT_STATE);
-
     // Init
-    err = persistenceProvider.Init(&storageDelegate);
+    ChipError err = persistenceProvider.Init(&storageDelegate);
     NL_TEST_ASSERT(inSuite, err == CHIP_NO_ERROR);
 
     // Store ByteSpan of size 1
+    uint8_t valueArray[1] = { 0x42 };
+    ByteSpan value(valueArray);
     err = persistenceProvider.WriteValue(TestConcretePath, value);
     NL_TEST_ASSERT(inSuite, err == CHIP_NO_ERROR);