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While a camera usually captures 2D images, it's common to sample only one row of pixels to improve temporal resolution. This gives a 1D profile across the divertor.
IR emission is transformed into a surface temperature measurement using some assumptions.
Surface temperature vs. time is transformed into a heat flux using a heat transfer model.
If the surface is clean and isn't very shiny, it's pretty easy.
If the surface has a coating that breaks the assumptions in the IR -> temperature or heat transfer models, errors are incurred.
If the surface has significant reflections, the camera will view IR light from other parts of the machine that are not relevant to heat flux on the surface of interest. This cannot be solved unless all the emissions and all the reflections are modeled.
I think we can assume that all that reflection tracking jazz is "part of the diagnostic" so that the output from the system is a good measurement of heat flux, with all the funky stuff accounted for already.
If we're allowed to treat the hard part as part of the diagnostic itself, then all we have to do is sample heat flux to the divertor target plate in the SOLPS model and report that as the profile.
So level 1 of this synthetic diagnostic is just doing the easy version. Doing anything more complicated should be in a separate issue called level 2, level 3, etc. Those are probably not necessary for this project.
Low priority due to reflections in SPARC divertor making signals exceedingly difficult to interpret. A next level synth diag that modeled reflections would be more useful.
While a camera usually captures 2D images, it's common to sample only one row of pixels to improve temporal resolution. This gives a 1D profile across the divertor.
IR emission is transformed into a surface temperature measurement using some assumptions.
Surface temperature vs. time is transformed into a heat flux using a heat transfer model.
If the surface is clean and isn't very shiny, it's pretty easy.
If the surface has a coating that breaks the assumptions in the IR -> temperature or heat transfer models, errors are incurred.
If the surface has significant reflections, the camera will view IR light from other parts of the machine that are not relevant to heat flux on the surface of interest. This cannot be solved unless all the emissions and all the reflections are modeled.
I think we can assume that all that reflection tracking jazz is "part of the diagnostic" so that the output from the system is a good measurement of heat flux, with all the funky stuff accounted for already.
If we're allowed to treat the hard part as part of the diagnostic itself, then all we have to do is sample heat flux to the divertor target plate in the SOLPS model and report that as the profile.
So level 1 of this synthetic diagnostic is just doing the easy version. Doing anything more complicated should be in a separate issue called level 2, level 3, etc. Those are probably not necessary for this project.
SynthDiag list on SPARC sharepoint
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