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As an instrument scientist on reflectometers (especially INTER), I would like to be able to disable the Keyence LK-G IOC from attempting to read the offset.
In order to read the offset & measurement modes, the IOC puts the device into "setup" mode, reads the offset, and then puts it back into "measure" mode. The scientists believe that this changing between modes is sometimes causing delays in reading the position, which they believe might have lead to a beamline alingment problem (?).
How?
Make the SCAN for offsets user-configurable - either by an IOC macro or by an autosaved dropdown selection (see e.g. instron for user-configurable scan rates). Scan options should be "5 second" or "Passive".
The OPI should clearly indicate that the offset & measure mode parameters are not scanning - or perhaps hide it entirely - if it is configured not to scan.
Acceptance criteria
As a user, I can choose to make the Keyence LK-G not scan the OFFSET parameter.
This means that the device no longer flicks between "measure" and "setup" modes
As a user, I can choose to make the Keyence LK-G scan the OFFSET parameter.
As above but for both measurement mode parameters (should use the same option)
There are IOC tests for the above
How to Test
verbose instructions for reviewer to test changes
(Add before making a PR)
The text was updated successfully, but these errors were encountered:
Tom-Willemsen
changed the title
Keyence LK-G: make reading offset configurable
Keyence LK-G: make reading offset and measurement mode configurable
Sep 22, 2022
Where?
As an instrument scientist on reflectometers (especially INTER), I would like to be able to disable the Keyence LK-G IOC from attempting to read the offset.
In order to read the offset & measurement modes, the IOC puts the device into "setup" mode, reads the offset, and then puts it back into "measure" mode. The scientists believe that this changing between modes is sometimes causing delays in reading the position, which they believe might have lead to a beamline alingment problem (?).
How?
Make the
SCAN
for offsets user-configurable - either by an IOC macro or by an autosaved dropdown selection (see e.g. instron for user-configurable scan rates). Scan options should be "5 second" or "Passive".The OPI should clearly indicate that the offset & measure mode parameters are not scanning - or perhaps hide it entirely - if it is configured not to scan.
Acceptance criteria
OFFSET
parameter.OFFSET
parameter.How to Test
verbose instructions for reviewer to test changes
(Add before making a PR)
The text was updated successfully, but these errors were encountered: